Delaware TSA Congratulates OUR 2016-17 DETSA State President Mr. Johnny Bui from Caesar Rodney Senior High School who has been honored as one of 161 Students From Across the Country that was Named as a 2017 United States of America Presidential Scholar! Read More: https://www.ed.gov/news/press-releases/161-students-across-country-named-2017-us-presidential-scholars
The 39th annual Delaware Technology Student Association conference was held on April 26-27, 2017 with over 1,000 students, advisors, coordinator, and judges from business and industry supporting over 37 schools from throughout the state in over 65 contests. Medalists will represent Delaware at the National Technology Student Association conference to held in Orlando, Florida this summer. Contestants will participate in events such as Architecture; CAD; Digital Video Production; Dragster Design; Engineering Design; Flight; Robotics; Structural Read more…
Medalists will represent Delaware at the National TSA Conference in Orlando, Florida, in June. Areas of competition include architecture, CAD, digital video production, dragster design, engineering design, flight, magnetic levitation vehicles, robotics, rocketry, structural engineering, system control technology, video game design and more. Each TSA event requires students to apply engineering and technology to solve problems and invent solutions. Read More on Delaware Online…
This concurrent resolution designates April 26, 2017, as Engineering and Technology Education Day. Read More on Delaware’s Legislative Website…
The 39th annual Delaware Technology Student Association (DETSA) State Conference is planned for April 26-27 with more than 960 students, advisors, and judges representing 37 high schools and middle schools from across the state in more than 65 contests. Media is invited to cover the conference at the Delaware State Fairgrounds in Harrington. Medalists will represent Delaware at the National TSA Conference in Orlando, Florida. Contests to be held will include: architecture, CAD, digital video Read more…